STRAIN INSPECTION DEVICE

PROBLEM TO BE SOLVED: To provide a strain inspection device that includes a drive mechanism to rotate a polarizing plate functioning as an analyzer and that does not require manual rotation by an inspector for inspection.SOLUTION: A strain inspection device 100 includes a camera 140, a second polari...

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Bibliographische Detailangaben
Hauptverfasser: SAKASHITA RYUICHI, YO HARUO, HONDA UMEHIKO, TAKADA TOMOMI
Format: Patent
Sprache:eng ; jpn
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a strain inspection device that includes a drive mechanism to rotate a polarizing plate functioning as an analyzer and that does not require manual rotation by an inspector for inspection.SOLUTION: A strain inspection device 100 includes a camera 140, a second polarizing plate 141, a quarter-wave plate 142, a first polarizing plate 143, a diffusion plate 144, a light source 145, and a drive mechanism to rotate the second polarizing plate in a stepwise way at a given angle. The camera 140, the second polarizing plate 141, the quarter-wave plate 142, the first polarizing plate 143, the diffusion plate 144, and the light source 145 are arranged on the same axis (an inspection axis); and the drive mechanism automatically rotates the second polarizing plate 141 functioning as an analyzer to measure a phase difference or an orientation of the optical axis. 【課題】アナライザーに相当する偏光板を回転させるための駆動機構を備え、検査者が手動で回転させることなく検査を行うことが可能な歪検査器を提供する。【解決手段】歪検査器100は、カメラ140と、第二偏光板141と、1/4波長板142と、第一偏光板143と、拡散板144と、光源145と、第二偏光板を任意の角度で段階的に回転させるための駆動機構とを備えている。カメラ140、第二偏光板141、1/4波長板142、第一偏光板143、拡散板144及び光源145は同一の軸(検査軸)上に配設されており、駆動機構がアナライザーに相当する第二偏光板141を自動的に回転させることにより、位相差や光軸方位を測定する。【選択図】図3