LINEAR DEFECT DETECTION DEVICE AND LINEAR DEFECT DETECTION METHOD

PROBLEM TO BE SOLVED: To detect a linear defect that can be formed in all directions, while keeping a processing quantity low.SOLUTION: A linear defect detection device comprises: an imaging unit 10 that acquires imaging data for a target object; an image data generation unit 20 that generates image data; a storage unit 30 that stores the image data; a data acquisition unit 40 that determines an attention pixel MP to be measured, sets a prescribed area symmetrical to a symmetrical axis SA including the attention pixel MP, connects an end pixel EP located at an end of the prescribed area and the attention pixel MP with a virtual line VL, and then acquires emphasis data on the basis of addition data obtained by adding luminance information for an addition pixel AP located on the virtual line VL; and a determination unit 50 that determines whether or not there is a linear defect, on the basis of the emphasis data. The data acquisition unit 40 displaces a direction of the virtual line VL by sequentially displacing the end pixel EP, and then sequentially acquires the addition data corresponding to the end of the prescribed area. 【課題】あらゆる方向で形成されうる線欠陥の検出を、処理量を低く抑えつつ行うこと。【解決手段】線欠陥検出装置は、対象物の像データを取得する撮像部１０と、画像データを作成する画像データ作成部２０と、画像データを記憶する記憶部３０と、測定対象となる注目画素ＭＰを決定し、当該注目画素ＭＰを含んだ対称軸ＳＡに対して対称形状となっている所定領域を設定し、当該所定領域の端部に位置する端部画素ＥＰと注目画素ＭＰとを仮想直線ＶＬで繋ぎ、仮想直線ＶＬ上に位置する加算画素ＡＰの輝度情報を足し合わせて得られた加算データに基づいて強調データを取得するデータ取得部４０と、強調データに基づいて線状の欠陥があるか否かを判断する判断部５０と、を備えている。データ取得部４０は、端部画素ＥＰを順次ずらすことで仮想直線ＶＬの方向をずらし、所定領域の端部に対応した加算データを順次取得する。【選択図】図３