DEVICE FOR PROCESSING SURFACE OF WAFER SHAPE ARTICLE
PROBLEM TO BE SOLVED: To provide a device for preventing the undesirable change in a process parameter due to condensation of process vapor, the damage or breakage of a delicate device structure on the workpiece due to condensed liquid drops, and reduction in throughput .SOLUTION: A device for proce...
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Format: | Patent |
Sprache: | eng ; jpn |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a device for preventing the undesirable change in a process parameter due to condensation of process vapor, the damage or breakage of a delicate device structure on the workpiece due to condensed liquid drops, and reduction in throughput .SOLUTION: A device for processing a wafer shape article includes a closed process chamber 1 which provides an airtight housing. A rotary chuck 30 is positioned inside the closed process chamber and adapted so as to hold the wafer shape article thereon. A lid 36 is fixed to an upper part of the closed process chamber and is provided with a lower surface directed to the inside of the chamber. By at least one heating element, the lower surface of the lid is heated to a desired temperature and process vapor is prevented from being condensed on the inward surface of the lid.
【課題】プロセス蒸気の凝縮によるプロセスパラメータの望ましくない変化や、凝縮された液滴によるワークピース上の繊細なデバイス構造の損壊、スループットの減少を防止する装置を提供する。【解決手段】ウェハ形状物品を処理するための装置が、気密筐体を提供する密閉型プロセスチャンバ1を備える。回転チャック30が、密閉型プロセスチャンバ内部に位置され、ウェハ形状物品を上に保持するように適合される。蓋36が、密閉型プロセスチャンバの上部に固定され、チャンバの内側に向いた下面を備える。少なくとも1つの加熱要素が、蓋の下面を所望の温度に加熱して、蓋の内向きの表面上でのプロセス蒸気の凝縮を防止する。【選択図】図1 |
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