CMOS INTEGRATED METHOD FOR RELEASE OF THERMOPILE PIXEL ON SUBSTRATE BY USING ANISOTROPIC AND ISOTROPIC ETCHING

PROBLEM TO BE SOLVED: To provide a method for manufacturing an imaging device.SOLUTION: The present method starts with providing a wafer having a membrane with an opening bonded to a substrate. A photoresist layer is deposited over the membrane and a wafer surface. A portion of the substrate back su...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: GRIGORE D HUMINIC, HERMANN KARAGOEZOGLU, RADU M MARINESCU, PHILIPPE VASSEUR
Format: Patent
Sprache:eng ; jpn
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a method for manufacturing an imaging device.SOLUTION: The present method starts with providing a wafer having a membrane with an opening bonded to a substrate. A photoresist layer is deposited over the membrane and a wafer surface. A portion of the substrate back surface under a central part of the membrane is etched anisotropically. A first region of the photoresist layer is removed to expose an opening in the membrane, so that a first isotropic etching of the substrate is performed through the opening of the membrane. A second region of the photoresist layer is peeled to expose a second opening of the membrane, so that a second isotropic etching of the substrate can be performed through the first and/or second opening of the membrane. 【課題】撮像デバイスを製造するための方法を提示する。【解決手段】本方法は、開口部を備えた膜が基板に接合されているウェーハを提供することから始まる。膜及びウェーハ表面の上にフォトレジスト層を付着させる。膜の中央部の下の基板の裏面の一部分に異方性エッチングを施す。フォトレジスト層の第1の領域を除去し、膜内の開口部を露出し、その結果、膜の開口部を通して基板の第1の等方性エッチングを実行する。フォトレジスト層の第2の領域を剥離し、膜の第2の開口部を露出し、膜の第1及び/又は第2の開口部を通して基板の第2の等方性エッチングを可能にする。【選択図】図2