INSPECTION JIG
PROBLEM TO BE SOLVED: To provide an inspection jig that enables improvement in positioning accuracy of a contact shoe contacting with a substrate.SOLUTION: An inspection jig 1 has: a frame 40; an electrode body 6 that includes an electrode 7; a conductive contact shoe 5 that has a wire-like shape; a...
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide an inspection jig that enables improvement in positioning accuracy of a contact shoe contacting with a substrate.SOLUTION: An inspection jig 1 has: a frame 40; an electrode body 6 that includes an electrode 7; a conductive contact shoe 5 that has a wire-like shape; a support block 100 that has a facing surface 2a having an inspected substrate A facedly arranged, guides one end of the contact shoe 5 to an inspection point of the inspected substrate A loaded in the facing surface 2a and guides one end of the contact shoe 5 to the electrode 7, and is relatively movable to the frame 40 in a movement direction intersecting the facing surface 2a; an urging part 14 that stays the support block 100 away from the electrode body 6, and urges the support block 100 in a direction heading for the inspected substrate A; and a regulation plate 9 which extends in an extension direction heading for the frame 40 from the support block 100, is provided between the support block 100 and the frame 40, and has a contraction property, and whose deformation is regulated with respect to a first direction parallel to the facing surface 2a and intersecting the extension direction.
【課題】基板に接触する接触子の位置決め精度を向上することができる検査治具を提供する。【解決手段】検査治具1は、フレーム40と、電極7を備える電極体6と、ワイヤ状の形状を有する導電性の接触子5と、被検査基板Aが対向配置される対向面2aを有し、対向面2aに載置された被検査基板Aの検査点へ接触子5の一端を案内し、接触子5の他端を電極7に案内し、かつ対向面2aと交差する移動方向に沿ってフレーム40に対して相対移動可能な支持ブロック100と、支持ブロック100を、電極体6から遠ざかり、被検査基板Aに向かう方向に付勢する付勢部14と、支持ブロック100からフレーム40に向かう延設方向に延びて支持ブロック100とフレーム40との間に架設され、伸縮性を有すると共に、対向面2aと平行かつ延設方向と交差する第1方向に対する変形が規制された規制プレート9とを備えた。【選択図】図1 |
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