DEVICE FOR MEASURING PARTICLE SIZE DISTRIBUTION
PROBLEM TO BE SOLVED: To reduce the time for calculating a particle size distribution by reducing the time for calculating a coefficient matrix K.SOLUTION: A device for measuring a particle size distribution includes a calculation unit 3 that receives light intensity signals output from light detect...
Gespeichert in:
1. Verfasser: | |
---|---|
Format: | Patent |
Sprache: | eng ; jpn |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | PROBLEM TO BE SOLVED: To reduce the time for calculating a particle size distribution by reducing the time for calculating a coefficient matrix K.SOLUTION: A device for measuring a particle size distribution includes a calculation unit 3 that receives light intensity signals output from light detectors 24 to calculate a particle size distribution of particles on the basis that a vector s is expressed in a predetermined expression including a product of a vector q and a coefficient matrix K. The calculation unit 3 calculates values of a plurality of first parameters depending on particle sizes of the particles used for calculation of one element among elements of the coefficient matrix K and a plurality of second parameters depending on a spread angle of diffracted/scattered light, and stores at least one of the values to use for calculation of another element of the coefficient matrix K.
【課題】係数行列Kの算出時間を短くすることによって、粒子径分布の算出時間を短縮する。【解決手段】光検出器24から出力された光強度信号を受信し、ベクトルsがベクトルqと係数行列Kとの積を含む所定式で表されることに基づいて粒子の粒子径分布を算出する演算部3とを具備し、演算部3が、係数行列Kの要素のうち1つの要素を算出するために用いられる前記粒子の粒子径に依存する複数の第1パラメータ及び前記回折/散乱光の拡がり角に依存する複数の第2パラメータの値を算出するとともに、これらの値のうち少なくとも1つを記憶して、前記係数行列Kの別の要素を算出するために用いるようにした。【選択図】図4 |
---|