INFRARED INSPECTION APPARATUS

PROBLEM TO BE SOLVED: To provide a technique for improving the accuracy of measuring a temperature difference around a surface of a structure and the accuracy of inspecting states such as defects and degradation of the surface of the structure in measurement and inspection using infrared.SOLUTION: A...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SASAZAWA HIDEAKI, YOSHITAKE YASUHIRO
Format:	Patent
Sprache:	eng ; jpn
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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