FOIL MANUFACTURING FACILITY, SHAPE ACCURACY CONTROL METHOD, FOIL MANUFACTURING CONTROL DEVICE, AND FOIL MANUFACTURING CONTROL PROGRAM

PROBLEM TO BE SOLVED: To provide a foil manufacturing facility, a shape accuracy control method, a foil manufacturing control device, and a foil manufacturing control program capable of improving and managing flatness accuracy of a foil.SOLUTION: A second measurement device 50 for measurement distor...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: MICHITANI TAKAHIRO, OKAMURA YOSHIHIDE
Format: Patent
Sprache:eng ; jpn
Schlagworte:
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