X-RAY INSPECTION SYSTEM AND X-RAY INSPECTION METHOD

PROBLEM TO BE SOLVED: To provide an X-ray inspection system and an X-ray inspection method capable of inspecting a soldered portion on the front side of a substrate with improved accuracy.SOLUTION: An X-ray inspection system comprises an X-ray inspection device 2 and an information processing device...

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1. Verfasser: NAKAHARA TATSUFUSA
Format: Patent
Sprache:eng
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