METHOD OF PREPARING SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY ANALYSIS

METHOD OF PREPARING SAMPLE FOR TRANSMISSION ELECTRON MICROSCOPY ANALYSIS

PROBLEM TO BE SOLVED: To provide a method of preparing a sample for transmission electron microscopy analysis for suppressing the peeling, deformation, or the like of various parts, when a film-shaped sample for TEM analysis is prepared with a microtome.SOLUTION: The method of preparing a sample for...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: FUSHIKI TAKANORI, YAMAMURA TAIZO, NAKAYAMA NORIYUKI
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a method of preparing a sample for transmission electron microscopy analysis for suppressing the peeling, deformation, or the like of various parts, when a film-shaped sample for TEM analysis is prepared with a microtome.SOLUTION: The method of preparing a sample for transmission electron microscopy analysis is a sample preparation method used for analyzing a film-shaped sample with a transmission electron microscope from the cross sectional direction. A film-shaped sample is prepared by fixing a film-shaped sample via a casting resin and by using a microtome. A cut surface formed of the film-shaped sample and the casting resin has at least one film end.