SYSTEMS AND METHODS FOR OHMIC CONTACTS IN SILICON CARBIDE DEVICES

PROBLEM TO BE SOLVED: To easily form ohmic contacts for silicon carbide devices without causing problems such as defects.SOLUTION: A silicon carbide device is presented that includes a gate electrode disposed over a portion of a silicon carbide substrate, and a dielectric film disposed over the gate electrode. The device has a contact region disposed near the gate electrode and has a layer disposed over the dielectric film and over the contact region. The layer includes nickel in portions disposed over the dielectric film and includes nickel silicide in portions disposed over the contact region. The nickel silicide layer is configured to provide an ohmic contact to the contact region of the silicon carbide device.