TEST AND MEASUREMENT INSTRUMENT, INPUT SIGNAL PROCESSING METHOD, AND COMPUTER PROGRAM THEREFOR

PROBLEM TO BE SOLVED: To automatically adjust a display center frequency and a span in a test and measurement instrument.SOLUTION: A test and measurement instrument includes a processor configured to digitize an input signal, locate a primary peak, and determine a primary peak center frequency of the input signal. The processor is configured to adjust the initial display center frequency setting on the basis of the primary peak center frequency. The processor is configured to perform a bandwidth comparison by comparing a bandwidth of the primary peak at a peak bandwidth test level to a peak bandwidth threshold. The processor is configured to adjust the initial span setting on the basis of the bandwidth comparison and generate a processed waveform signal by using the adjusted display center frequency and span settings.