NON-CONTACT VOLTAGE MEASURING PROBE

PROBLEM TO BE SOLVED: To provide a non-contact voltage measuring probe that can measure a voltage waveform between two lines with a simple non-contact sensor configuration.SOLUTION: The non-contact voltage measuring probe comprises cylindrical electrodes 101 and 102 which surround two electric wires...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: SUZUKI YASUNAO, KOZAI MASAKI, TAKATANI KAZUHIRO
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a non-contact voltage measuring probe that can measure a voltage waveform between two lines with a simple non-contact sensor configuration.SOLUTION: The non-contact voltage measuring probe comprises cylindrical electrodes 101 and 102 which surround two electric wires L1, L2 as measuring object respectively, with each of the electrodes having a central axis substantially coincide with that of each of the electric wires. Line-to-line voltage Vo between the electric wire L1 and the electric wire L2 is measured indirectly by measuring a voltage between the electrode 101 and the electrode 102 with a voltage measurement device 110. In a case where the electric wires L1, L2 that are uncoated are measured, an insulator or dielectric as a spacer may be interposed between the electrodes 101, 102 and the electric wires L1, L2, respectively, to prevent unwanted contacts therebetween. When the dielectric is interposed, the values of electrostatic capacitance C1, C2 are increased compared with no dielectric, resulting in improved sensibility. Designing the shape of the spacer properly corresponding to the electric wires L1, L2 facilitates fixing of the electric wires onto the central axes of the electrodes 101, 102.