PROBE SUPPORT DEVICE

PROBLEM TO BE SOLVED: To provide a probe support device capable of supporting a probe so that the probe can be positioned approximately directly above a subject region, while keeping costs low.SOLUTION: A probe support device for use includes a base part, an arm part that is connected to an upper en...

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Bibliographische Detailangaben
Hauptverfasser: NAGAMINE EMI, NOGUCHI TAKAHIRO, KUNO YOSHIKI, WATANABE KAZUHIRO, KAKO WATARU, NAKADA TAKESHI, TAKIZAWA SAKIKO, MOROTA SHIHOKO
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a probe support device capable of supporting a probe so that the probe can be positioned approximately directly above a subject region, while keeping costs low.SOLUTION: A probe support device for use includes a base part, an arm part that is connected to an upper end of the base part to be vertically swingable and horizontally rotatable, and a probe support part that is connected to a tip on the side, opposite to a part connected to the base part, of the arm part. The probe support part comprises a deformed part and an undeformed part. The undeformed part is connected to the tip of the arm part in such a manner as to be rotatable with respect to the axis parallel to the axis of rotation when the arm part is vertically swung.