SEMICONDUCTOR DEVICE MANUFACTURING METHOD

PROBLEM TO BE SOLVED: To improve reliability of a semiconductor device.SOLUTION: In a semiconductor device of an embodiment 1, a mark MK1 corresponding to a bonding region of a belt-like wiring BLW exposed from an opening OP1 which is formed in a solder resist SR is provided. By doing this, a coordi...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: YASUNAGA MASATOSHI, KURODA SOJI, HIRONAGA KAZUYA, HIRAI TATSUYA
Format: Patent
Sprache:eng
Schlagworte:
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