TWO-DIMENSIONAL SPECTRAL MEASUREMENT DEVICE, AND TWO-DIMENSIONAL SPECTRAL MEASUREMENT METHOD
PROBLEM TO BE SOLVED: To generate an interferogram on an image formation surface when an object S to be measured is a low scattering body or a low diffusivity body such as a liquid.SOLUTION: A two-dimensional spectral measurement device comprises: an object lens which light emitted from an object to...
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| creator | KAWAJIRI TAKESHI UODOME ATSUSHI |
| description | PROBLEM TO BE SOLVED: To generate an interferogram on an image formation surface when an object S to be measured is a low scattering body or a low diffusivity body such as a liquid.SOLUTION: A two-dimensional spectral measurement device comprises: an object lens which light emitted from an object to be measured enters; a phase shifter disposed at the rear of the object lens; an imaging lens which light reflected at the phase shifter enters; a detector disposed on an image formation surface of the imaging lens; and an optical element which is disposed at the front of the object lens and which diffuses light transmitted through the object to be measured which is a low scattering body or a low diffusivity body. The light transmitted through the object to be measured is scattered by the optical element to enter the object lens. The entering light is interfered by the phase shifter, thus an interferogram is generated on the image formation surface. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2014048096A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2014048096A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2014048096A3</originalsourceid><addsrcrecordid>eNrjZIgJCffXdfH0dfUL9vT3c_RRCA5wdQ4JAjJ8XR2DQ4NcgTIhCi6uYZ7OrjoKjn4uCkRp8HUN8fB34WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaGJgYmFgaWZo7GRCkCAE3jMyc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TWO-DIMENSIONAL SPECTRAL MEASUREMENT DEVICE, AND TWO-DIMENSIONAL SPECTRAL MEASUREMENT METHOD</title><source>esp@cenet</source><creator>KAWAJIRI TAKESHI ; UODOME ATSUSHI</creator><creatorcontrib>KAWAJIRI TAKESHI ; UODOME ATSUSHI</creatorcontrib><description>PROBLEM TO BE SOLVED: To generate an interferogram on an image formation surface when an object S to be measured is a low scattering body or a low diffusivity body such as a liquid.SOLUTION: A two-dimensional spectral measurement device comprises: an object lens which light emitted from an object to be measured enters; a phase shifter disposed at the rear of the object lens; an imaging lens which light reflected at the phase shifter enters; a detector disposed on an image formation surface of the imaging lens; and an optical element which is disposed at the front of the object lens and which diffuses light transmitted through the object to be measured which is a low scattering body or a low diffusivity body. The light transmitted through the object to be measured is scattered by the optical element to enter the object lens. The entering light is interfered by the phase shifter, thus an interferogram is generated on the image formation surface.</description><language>eng</language><subject>COLORIMETRY ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2014</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140317&DB=EPODOC&CC=JP&NR=2014048096A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20140317&DB=EPODOC&CC=JP&NR=2014048096A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KAWAJIRI TAKESHI</creatorcontrib><creatorcontrib>UODOME ATSUSHI</creatorcontrib><title>TWO-DIMENSIONAL SPECTRAL MEASUREMENT DEVICE, AND TWO-DIMENSIONAL SPECTRAL MEASUREMENT METHOD</title><description>PROBLEM TO BE SOLVED: To generate an interferogram on an image formation surface when an object S to be measured is a low scattering body or a low diffusivity body such as a liquid.SOLUTION: A two-dimensional spectral measurement device comprises: an object lens which light emitted from an object to be measured enters; a phase shifter disposed at the rear of the object lens; an imaging lens which light reflected at the phase shifter enters; a detector disposed on an image formation surface of the imaging lens; and an optical element which is disposed at the front of the object lens and which diffuses light transmitted through the object to be measured which is a low scattering body or a low diffusivity body. The light transmitted through the object to be measured is scattered by the optical element to enter the object lens. The entering light is interfered by the phase shifter, thus an interferogram is generated on the image formation surface.</description><subject>COLORIMETRY</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2014</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIgJCffXdfH0dfUL9vT3c_RRCA5wdQ4JAjJ8XR2DQ4NcgTIhCi6uYZ7OrjoKjn4uCkRp8HUN8fB34WFgTUvMKU7lhdLcDEpuriHOHrqpBfnxqcUFicmpeakl8V4BRgaGJgYmFgaWZo7GRCkCAE3jMyc</recordid><startdate>20140317</startdate><enddate>20140317</enddate><creator>KAWAJIRI TAKESHI</creator><creator>UODOME ATSUSHI</creator><scope>EVB</scope></search><sort><creationdate>20140317</creationdate><title>TWO-DIMENSIONAL SPECTRAL MEASUREMENT DEVICE, AND TWO-DIMENSIONAL SPECTRAL MEASUREMENT METHOD</title><author>KAWAJIRI TAKESHI ; UODOME ATSUSHI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2014048096A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2014</creationdate><topic>COLORIMETRY</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KAWAJIRI TAKESHI</creatorcontrib><creatorcontrib>UODOME ATSUSHI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KAWAJIRI TAKESHI</au><au>UODOME ATSUSHI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TWO-DIMENSIONAL SPECTRAL MEASUREMENT DEVICE, AND TWO-DIMENSIONAL SPECTRAL MEASUREMENT METHOD</title><date>2014-03-17</date><risdate>2014</risdate><abstract>PROBLEM TO BE SOLVED: To generate an interferogram on an image formation surface when an object S to be measured is a low scattering body or a low diffusivity body such as a liquid.SOLUTION: A two-dimensional spectral measurement device comprises: an object lens which light emitted from an object to be measured enters; a phase shifter disposed at the rear of the object lens; an imaging lens which light reflected at the phase shifter enters; a detector disposed on an image formation surface of the imaging lens; and an optical element which is disposed at the front of the object lens and which diffuses light transmitted through the object to be measured which is a low scattering body or a low diffusivity body. The light transmitted through the object to be measured is scattered by the optical element to enter the object lens. The entering light is interfered by the phase shifter, thus an interferogram is generated on the image formation surface.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING |
| title | TWO-DIMENSIONAL SPECTRAL MEASUREMENT DEVICE, AND TWO-DIMENSIONAL SPECTRAL MEASUREMENT METHOD |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T14%3A57%3A26IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KAWAJIRI%20TAKESHI&rft.date=2014-03-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2014048096A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |