TWO-DIMENSIONAL SPECTRAL MEASUREMENT DEVICE, AND TWO-DIMENSIONAL SPECTRAL MEASUREMENT METHOD

PROBLEM TO BE SOLVED: To generate an interferogram on an image formation surface when an object S to be measured is a low scattering body or a low diffusivity body such as a liquid.SOLUTION: A two-dimensional spectral measurement device comprises: an object lens which light emitted from an object to...

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Hauptverfasser: KAWAJIRI TAKESHI, UODOME ATSUSHI
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To generate an interferogram on an image formation surface when an object S to be measured is a low scattering body or a low diffusivity body such as a liquid.SOLUTION: A two-dimensional spectral measurement device comprises: an object lens which light emitted from an object to be measured enters; a phase shifter disposed at the rear of the object lens; an imaging lens which light reflected at the phase shifter enters; a detector disposed on an image formation surface of the imaging lens; and an optical element which is disposed at the front of the object lens and which diffuses light transmitted through the object to be measured which is a low scattering body or a low diffusivity body. The light transmitted through the object to be measured is scattered by the optical element to enter the object lens. The entering light is interfered by the phase shifter, thus an interferogram is generated on the image formation surface.