SAMPLE HOLDER
PROBLEM TO BE SOLVED: To provide a sample holder capable of improving thickness distribution of a thin film formed on a substrate by a plasma CVD method.SOLUTION: A sample holder 10 housed in a plasma CVD device and positioned at a position opposed to an electrode arranged in a comb-like manner has...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | PROBLEM TO BE SOLVED: To provide a sample holder capable of improving thickness distribution of a thin film formed on a substrate by a plasma CVD method.SOLUTION: A sample holder 10 housed in a plasma CVD device and positioned at a position opposed to an electrode arranged in a comb-like manner has a rectangular substrate mounting face 11 in which mounting regions 110 for mounting a substrate that is a processing object are defined. At least one part of a region along an outer edge of the substrate mounting face is a rough surface region with larger surface roughness than that of the other region of the substrate mounting face. |
---|