SAMPLE HOLDER

PROBLEM TO BE SOLVED: To provide a sample holder capable of improving thickness distribution of a thin film formed on a substrate by a plasma CVD method.SOLUTION: A sample holder 10 housed in a plasma CVD device and positioned at a position opposed to an electrode arranged in a comb-like manner has...

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Bibliographische Detailangaben
Hauptverfasser: SARUWATARI TETSUYA, IMAI DAISUKE
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a sample holder capable of improving thickness distribution of a thin film formed on a substrate by a plasma CVD method.SOLUTION: A sample holder 10 housed in a plasma CVD device and positioned at a position opposed to an electrode arranged in a comb-like manner has a rectangular substrate mounting face 11 in which mounting regions 110 for mounting a substrate that is a processing object are defined. At least one part of a region along an outer edge of the substrate mounting face is a rough surface region with larger surface roughness than that of the other region of the substrate mounting face.