METHOD FOR TESTING ELECTRONIC CONTROL SYSTEM

PROBLEM TO BE SOLVED: To provide a scheduling method for executing at least one test model on a test device.SOLUTION: A first scheduler is activated on the basis of an external activate signal. The first scheduler executes a test model or a prescribed part of the test model corresponding to a prescr...

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Hauptverfasser: LEINFELLNER ROBERT, WOELFER THOMAS, RICHERT JOBST, GROSSE BOERGER RALF, BRUSKI NICOLA, MILLER EDUARD, KRISP HOLGER
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a scheduling method for executing at least one test model on a test device.SOLUTION: A first scheduler is activated on the basis of an external activate signal. The first scheduler executes a test model or a prescribed part of the test model corresponding to a prescribed computation interval. After execution of the test model or the prescribed part of the test model is over, the first scheduler shows completion of the computation by a termination signal. When the test model has a plurality of test systems to which simultaneous processing should be performed, the first scheduler calls a second scheduler and instructs a test system to which simultaneous processing is to be performed. The second scheduler serially executes the test system to which the simultaneous processing is to be performed. The second scheduler shows the first scheduler execution completion after all the test systems to which the simultaneous processing is to be performed are processed, and the first scheduler shows completion of the computation by a termination signal.