METHOD AND APPARATUS FOR COLLECTING SAMPLE FRACTIONS AND ANALYZING SAMPLES

PROBLEM TO BE SOLVED: To provide a method for efficiently and effectively analyzing samples in a chromatography system and a method for collecting sample fractions.SOLUTION: A method for detecting and collecting one or more sample elements in a sample flow in a chromatography system 40 during the pe...

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Hauptverfasser:	BRUCE D BLACK, RAAIDAH SAARI-NORDHAUS, MENDOZA WASHINGTON, DENIS K MCCREERY, JAMES M ANDERSON JR, DARC HERGEMO, KARL H POPPER, JOSEPH P VISTORON, NEAL R PISYA, NELSON SHELDON
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a method for efficiently and effectively analyzing samples in a chromatography system and a method for collecting sample fractions.SOLUTION: A method for detecting and collecting one or more sample elements in a sample flow in a chromatography system 40 during the performance of chromatography comprises the steps of: generating a first signal from at least one destructive detector 13 including at least one evaporating particle detector during the performance of the chromatography; and generating a second signal from at least one nondestructive detector 16 during the performance of the chromatography. The method has a step of collecting the one or more sample elements from the flow in a fraction collector during the performance of the chromatography, in response to changes of the signal during the performance of the chromatography.