DEVICE AND METHOD FOR ETCHING

PROBLEM TO BE SOLVED: To solve such a problem that, when a fine circuit pattern is formed during a circuit forming process of a copper-clad substrate, a line width of a circuit pattern is likely to vary depending on the level of skill of operators in the conventional control methods where processing...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: YONETAKE SATORU, NISHIMURA NAOKI, SATO SHINICHI
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To solve such a problem that, when a fine circuit pattern is formed during a circuit forming process of a copper-clad substrate, a line width of a circuit pattern is likely to vary depending on the level of skill of operators in the conventional control methods where processing time in an etching treatment process is changed on the basis of a line width data measurement result of an appearance inspection performed after the circuit forming process to obtain a uniform line width.SOLUTION: When a fine circuit pattern is formed during a circuit forming process of a copper-clad substrate, a concentration of an etchant in an etching treatment process is changed on the basis of a line width data measurement result of an appearance inspection performed after the circuit forming process to uniformly control the line width of the circuit pattern.