DROP TEST DEVICE AND DROP TEST METHOD
PROBLEM TO BE SOLVED: To provide a drop test device and a drop test method which can achieve the reduction in costs by simplifying a configuration, which enable a measurement object to freely drop down in an arbitrary attitude, and which can achieve the improvement in repeatability of a drop test.SO...
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| creator | HOSHINO MANABU KAWADA NORIYUKI |
| description | PROBLEM TO BE SOLVED: To provide a drop test device and a drop test method which can achieve the reduction in costs by simplifying a configuration, which enable a measurement object to freely drop down in an arbitrary attitude, and which can achieve the improvement in repeatability of a drop test.SOLUTION: In a drop test method, a test piece 300 as a measurement object is dropped down so that a physical quantity applied to the test piece 300 is detected by a detection sensor part 16. A drop test device 10A includes: a holder 26 which can hold the test piece 300 in such a manner that the test piece 300 can be detached and which releases a state of holding the test piece 300 at the start of dropping; a guide mechanism 24 specifying a drop path of a portion of the test piece 300, which is held by the holder 26; and an initial attitude adaptor 30 which is provided between the holder 26 and the guide mechanism 24 and which can adjust an initial attitude of the test piece 300. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2013231650A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2013231650A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2013231650A3</originalsourceid><addsrcrecordid>eNrjZFB1CfIPUAhxDQ5RcHEN83R2VXD0c1FACPq6hnj4u_AwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDQ2MjY0MzUwNHY6IUAQDD9iNc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DROP TEST DEVICE AND DROP TEST METHOD</title><source>esp@cenet</source><creator>HOSHINO MANABU ; KAWADA NORIYUKI</creator><creatorcontrib>HOSHINO MANABU ; KAWADA NORIYUKI</creatorcontrib><description>PROBLEM TO BE SOLVED: To provide a drop test device and a drop test method which can achieve the reduction in costs by simplifying a configuration, which enable a measurement object to freely drop down in an arbitrary attitude, and which can achieve the improvement in repeatability of a drop test.SOLUTION: In a drop test method, a test piece 300 as a measurement object is dropped down so that a physical quantity applied to the test piece 300 is detected by a detection sensor part 16. A drop test device 10A includes: a holder 26 which can hold the test piece 300 in such a manner that the test piece 300 can be detached and which releases a state of holding the test piece 300 at the start of dropping; a guide mechanism 24 specifying a drop path of a portion of the test piece 300, which is held by the holder 26; and an initial attitude adaptor 30 which is provided between the holder 26 and the guide mechanism 24 and which can adjust an initial attitude of the test piece 300.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131114&DB=EPODOC&CC=JP&NR=2013231650A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131114&DB=EPODOC&CC=JP&NR=2013231650A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HOSHINO MANABU</creatorcontrib><creatorcontrib>KAWADA NORIYUKI</creatorcontrib><title>DROP TEST DEVICE AND DROP TEST METHOD</title><description>PROBLEM TO BE SOLVED: To provide a drop test device and a drop test method which can achieve the reduction in costs by simplifying a configuration, which enable a measurement object to freely drop down in an arbitrary attitude, and which can achieve the improvement in repeatability of a drop test.SOLUTION: In a drop test method, a test piece 300 as a measurement object is dropped down so that a physical quantity applied to the test piece 300 is detected by a detection sensor part 16. A drop test device 10A includes: a holder 26 which can hold the test piece 300 in such a manner that the test piece 300 can be detached and which releases a state of holding the test piece 300 at the start of dropping; a guide mechanism 24 specifying a drop path of a portion of the test piece 300, which is held by the holder 26; and an initial attitude adaptor 30 which is provided between the holder 26 and the guide mechanism 24 and which can adjust an initial attitude of the test piece 300.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB1CfIPUAhxDQ5RcHEN83R2VXD0c1FACPq6hnj4u_AwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDQ2MjY0MzUwNHY6IUAQDD9iNc</recordid><startdate>20131114</startdate><enddate>20131114</enddate><creator>HOSHINO MANABU</creator><creator>KAWADA NORIYUKI</creator><scope>EVB</scope></search><sort><creationdate>20131114</creationdate><title>DROP TEST DEVICE AND DROP TEST METHOD</title><author>HOSHINO MANABU ; KAWADA NORIYUKI</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2013231650A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HOSHINO MANABU</creatorcontrib><creatorcontrib>KAWADA NORIYUKI</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HOSHINO MANABU</au><au>KAWADA NORIYUKI</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DROP TEST DEVICE AND DROP TEST METHOD</title><date>2013-11-14</date><risdate>2013</risdate><abstract>PROBLEM TO BE SOLVED: To provide a drop test device and a drop test method which can achieve the reduction in costs by simplifying a configuration, which enable a measurement object to freely drop down in an arbitrary attitude, and which can achieve the improvement in repeatability of a drop test.SOLUTION: In a drop test method, a test piece 300 as a measurement object is dropped down so that a physical quantity applied to the test piece 300 is detected by a detection sensor part 16. A drop test device 10A includes: a holder 26 which can hold the test piece 300 in such a manner that the test piece 300 can be detached and which releases a state of holding the test piece 300 at the start of dropping; a guide mechanism 24 specifying a drop path of a portion of the test piece 300, which is held by the holder 26; and an initial attitude adaptor 30 which is provided between the holder 26 and the guide mechanism 24 and which can adjust an initial attitude of the test piece 300.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | DROP TEST DEVICE AND DROP TEST METHOD |
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