DROP TEST DEVICE AND DROP TEST METHOD

PROBLEM TO BE SOLVED: To provide a drop test device and a drop test method which can achieve the reduction in costs by simplifying a configuration, which enable a measurement object to freely drop down in an arbitrary attitude, and which can achieve the improvement in repeatability of a drop test.SO...

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Bibliographische Detailangaben
Hauptverfasser: HOSHINO MANABU, KAWADA NORIYUKI
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a drop test device and a drop test method which can achieve the reduction in costs by simplifying a configuration, which enable a measurement object to freely drop down in an arbitrary attitude, and which can achieve the improvement in repeatability of a drop test.SOLUTION: In a drop test method, a test piece 300 as a measurement object is dropped down so that a physical quantity applied to the test piece 300 is detected by a detection sensor part 16. A drop test device 10A includes: a holder 26 which can hold the test piece 300 in such a manner that the test piece 300 can be detached and which releases a state of holding the test piece 300 at the start of dropping; a guide mechanism 24 specifying a drop path of a portion of the test piece 300, which is held by the holder 26; and an initial attitude adaptor 30 which is provided between the holder 26 and the guide mechanism 24 and which can adjust an initial attitude of the test piece 300.