POSITION DETECTOR

PROBLEM TO BE SOLVED: To provide a position detector which secures functional safety and which achieves the simplification of circuit structure for performing malfunction detection.SOLUTION: A second position signal POS2 setting a second wavelength λ2 coarser than a first position signal POS1 in a m...

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1. Verfasser:	FUKUZONO SEIICHI
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a position detector which secures functional safety and which achieves the simplification of circuit structure for performing malfunction detection.SOLUTION: A second position signal POS2 setting a second wavelength λ2 coarser than a first position signal POS1 in a minimum resolution unit λ1/N, which is generated by a first signal processor 31A, as a resolution unit and a third position signal POS3 setting the first wavelength λ1 as the resolution unit are compared by a first comparison processor 321A, so that malfunction detection is performed.