NON-CONTACT TYPE DISTORTION MEASURING APPARATUS, AND NON-CONTACT TYPE DISTORTION MEASURING METHOD

NON-CONTACT TYPE DISTORTION MEASURING APPARATUS, AND NON-CONTACT TYPE DISTORTION MEASURING METHOD

PROBLEM TO BE SOLVED: To provide a non-contact type distortion measuring apparatus, and a non-contact type distortion measuring method for accurately measuring a predetermined physical amount regarding distortion of a specific area when the distortion is concentrated on the area in a test piece.SOLU...

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Hauptverfasser: NAKAMICHI DAISUKE, YONEDA YASUSHI
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator NAKAMICHI DAISUKE
YONEDA YASUSHI
description PROBLEM TO BE SOLVED: To provide a non-contact type distortion measuring apparatus, and a non-contact type distortion measuring method for accurately measuring a predetermined physical amount regarding distortion of a specific area when the distortion is concentrated on the area in a test piece.SOLUTION: The present invention includes: an imaging part 3 which captures an image of a test piece 2 to be measured; and physical amount derivation parts 50, 50B which detect an area Ar on which distortion is concentrated in the test piece 2 from image data on the test piece 2 acquired by the imaging part 3, to calculate predetermined physical amounts , regarding the distortion of the test piece 2 in the area Ar.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title NON-CONTACT TYPE DISTORTION MEASURING APPARATUS, AND NON-CONTACT TYPE DISTORTION MEASURING METHOD
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