NON-CONTACT TYPE DISTORTION MEASURING APPARATUS, AND NON-CONTACT TYPE DISTORTION MEASURING METHOD

PROBLEM TO BE SOLVED: To provide a non-contact type distortion measuring apparatus, and a non-contact type distortion measuring method for accurately measuring a predetermined physical amount regarding distortion of a specific area when the distortion is concentrated on the area in a test piece.SOLU...

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Bibliographische Detailangaben
Hauptverfasser:	NAKAMICHI DAISUKE, YONEDA YASUSHI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a non-contact type distortion measuring apparatus, and a non-contact type distortion measuring method for accurately measuring a predetermined physical amount regarding distortion of a specific area when the distortion is concentrated on the area in a test piece.SOLUTION: The present invention includes: an imaging part 3 which captures an image of a test piece 2 to be measured; and physical amount derivation parts 50, 50B which detect an area Ar on which distortion is concentrated in the test piece 2 from image data on the test piece 2 acquired by the imaging part 3, to calculate predetermined physical amounts , regarding the distortion of the test piece 2 in the area Ar.