INSPECTION STAGE APPARATUS AND SUBSTRATE INSPECTION APPARATUS

PROBLEM TO BE SOLVED: To prevent a substrate from sticking on an inspection stage where the substrate is to be mounted on.SOLUTION: An inspection stage apparatus comprises a stage 2. The stage 2 includes substrate holding parts 201 to 214 whose substrate mounting surfaces are irregular and having po...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HAYANO AKIRA, SUZUKI SHINJI, IEDA MASATSUNE
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator HAYANO AKIRA
SUZUKI SHINJI
IEDA MASATSUNE
description PROBLEM TO BE SOLVED: To prevent a substrate from sticking on an inspection stage where the substrate is to be mounted on.SOLUTION: An inspection stage apparatus comprises a stage 2. The stage 2 includes substrate holding parts 201 to 214 whose substrate mounting surfaces are irregular and having pool-like concave parts 241 to 251. The pool-like concave parts 241 to 251 are provided with vacuum suction holes 24 and air pressure holes 25, so that a substrate contacts the substrate mounting surface at a minimum area as far as possible. In addition, the air pressure holes for releasing a vacuum state are provided apart from the vacuum suction holes, so that the substrate can be efficiently prevented from sticking on the concave parts. The concave parts are provided on a part of the substrate holding part, and concave grooves having both sides in a same hight with the concave parts are provided on the rest of the substrate holding part. The concave parts are provided at four corners, in a way to fit a size of the substrate. Pin relief holes are arranged in a zigzag pattern, so that various sizes of glass substrates can be accepted.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2013207104A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2013207104A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2013207104A3</originalsourceid><addsrcrecordid>eNrjZLD19AsOcHUO8fT3UwgOcXR3VXAMCHAMcgwJDVZw9HNRCA51Cg4Bcl0VkBTClfAwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDQ2MjA3NDAxNHY6IUAQCw4iqe</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INSPECTION STAGE APPARATUS AND SUBSTRATE INSPECTION APPARATUS</title><source>esp@cenet</source><creator>HAYANO AKIRA ; SUZUKI SHINJI ; IEDA MASATSUNE</creator><creatorcontrib>HAYANO AKIRA ; SUZUKI SHINJI ; IEDA MASATSUNE</creatorcontrib><description>PROBLEM TO BE SOLVED: To prevent a substrate from sticking on an inspection stage where the substrate is to be mounted on.SOLUTION: An inspection stage apparatus comprises a stage 2. The stage 2 includes substrate holding parts 201 to 214 whose substrate mounting surfaces are irregular and having pool-like concave parts 241 to 251. The pool-like concave parts 241 to 251 are provided with vacuum suction holes 24 and air pressure holes 25, so that a substrate contacts the substrate mounting surface at a minimum area as far as possible. In addition, the air pressure holes for releasing a vacuum state are provided apart from the vacuum suction holes, so that the substrate can be efficiently prevented from sticking on the concave parts. The concave parts are provided on a part of the substrate holding part, and concave grooves having both sides in a same hight with the concave parts are provided on the rest of the substrate holding part. The concave parts are provided at four corners, in a way to fit a size of the substrate. Pin relief holes are arranged in a zigzag pattern, so that various sizes of glass substrates can be accepted.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20131007&amp;DB=EPODOC&amp;CC=JP&amp;NR=2013207104A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20131007&amp;DB=EPODOC&amp;CC=JP&amp;NR=2013207104A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HAYANO AKIRA</creatorcontrib><creatorcontrib>SUZUKI SHINJI</creatorcontrib><creatorcontrib>IEDA MASATSUNE</creatorcontrib><title>INSPECTION STAGE APPARATUS AND SUBSTRATE INSPECTION APPARATUS</title><description>PROBLEM TO BE SOLVED: To prevent a substrate from sticking on an inspection stage where the substrate is to be mounted on.SOLUTION: An inspection stage apparatus comprises a stage 2. The stage 2 includes substrate holding parts 201 to 214 whose substrate mounting surfaces are irregular and having pool-like concave parts 241 to 251. The pool-like concave parts 241 to 251 are provided with vacuum suction holes 24 and air pressure holes 25, so that a substrate contacts the substrate mounting surface at a minimum area as far as possible. In addition, the air pressure holes for releasing a vacuum state are provided apart from the vacuum suction holes, so that the substrate can be efficiently prevented from sticking on the concave parts. The concave parts are provided on a part of the substrate holding part, and concave grooves having both sides in a same hight with the concave parts are provided on the rest of the substrate holding part. The concave parts are provided at four corners, in a way to fit a size of the substrate. Pin relief holes are arranged in a zigzag pattern, so that various sizes of glass substrates can be accepted.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLD19AsOcHUO8fT3UwgOcXR3VXAMCHAMcgwJDVZw9HNRCA51Cg4Bcl0VkBTClfAwsKYl5hSn8kJpbgYlN9cQZw_d1IL8-NTigsTk1LzUknivACMDQ2MjA3NDAxNHY6IUAQCw4iqe</recordid><startdate>20131007</startdate><enddate>20131007</enddate><creator>HAYANO AKIRA</creator><creator>SUZUKI SHINJI</creator><creator>IEDA MASATSUNE</creator><scope>EVB</scope></search><sort><creationdate>20131007</creationdate><title>INSPECTION STAGE APPARATUS AND SUBSTRATE INSPECTION APPARATUS</title><author>HAYANO AKIRA ; SUZUKI SHINJI ; IEDA MASATSUNE</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2013207104A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>HAYANO AKIRA</creatorcontrib><creatorcontrib>SUZUKI SHINJI</creatorcontrib><creatorcontrib>IEDA MASATSUNE</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HAYANO AKIRA</au><au>SUZUKI SHINJI</au><au>IEDA MASATSUNE</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INSPECTION STAGE APPARATUS AND SUBSTRATE INSPECTION APPARATUS</title><date>2013-10-07</date><risdate>2013</risdate><abstract>PROBLEM TO BE SOLVED: To prevent a substrate from sticking on an inspection stage where the substrate is to be mounted on.SOLUTION: An inspection stage apparatus comprises a stage 2. The stage 2 includes substrate holding parts 201 to 214 whose substrate mounting surfaces are irregular and having pool-like concave parts 241 to 251. The pool-like concave parts 241 to 251 are provided with vacuum suction holes 24 and air pressure holes 25, so that a substrate contacts the substrate mounting surface at a minimum area as far as possible. In addition, the air pressure holes for releasing a vacuum state are provided apart from the vacuum suction holes, so that the substrate can be efficiently prevented from sticking on the concave parts. The concave parts are provided on a part of the substrate holding part, and concave grooves having both sides in a same hight with the concave parts are provided on the rest of the substrate holding part. The concave parts are provided at four corners, in a way to fit a size of the substrate. Pin relief holes are arranged in a zigzag pattern, so that various sizes of glass substrates can be accepted.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_JP2013207104A
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title INSPECTION STAGE APPARATUS AND SUBSTRATE INSPECTION APPARATUS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-01T13%3A43%3A37IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HAYANO%20AKIRA&rft.date=2013-10-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2013207104A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true