OFF-LINE ADJUSTMENT DEVICE

PROBLEM TO BE SOLVED: To provide an off-line adjustment device that can generate an imaging state equivalent to a state when imaging an inspected material running on a manufacturing line at an on-line position, and can be installed in a small space.SOLUTION: An off-line adjustment device 200 of a su...

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Bibliographische Detailangaben
1. Verfasser: SHIGA SHUNSUKE
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide an off-line adjustment device that can generate an imaging state equivalent to a state when imaging an inspected material running on a manufacturing line at an on-line position, and can be installed in a small space.SOLUTION: An off-line adjustment device 200 of a surface inspection device 100 movable in a direction parallel with a width direction of a zone-shaped inspected material comprises: a sample plate fixation stage 221 to which flat tabular sample plates 2 and 3 are inclined at a predetermined angle with respect to a horizontal surface and attached in parallel to a movement direction of the surface inspection device 100; a slide mechanism 222 or the like that slides the sample plates 2 and 3 attached to the sample fixation stage 221 in a direction of the predetermined angle with the attached state maintained; and a PLG 225 for the off-line adjustment device that acquires position information on the sample plates 2 and 3. Each part is configured such that an imaging target position of the surface inspection device 100 with respect to the zone-shape inspected material is arranged on surfaces of the sample plates 2 and 3 attached to the sample plate fixation stage.