ANALYSIS SYSTEM, ANALYZING DEVICE, MANAGEMENT DEVICE, AND COMPUTER PROGRAM

PROBLEM TO BE SOLVED: To enable keeping track of the registration of measurement parameters at the management side in preparation for the case when the measurement parameters are erroneously registered.SOLUTION: An analysis system 1 includes: an analyzing device 100 for performing the analysis of a...

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Bibliographische Detailangaben
Hauptverfasser:	YAO SHUNSUKE, NISHIDA TAISUKE, KUWAOKA SHIRO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To enable keeping track of the registration of measurement parameters at the management side in preparation for the case when the measurement parameters are erroneously registered.SOLUTION: An analysis system 1 includes: an analyzing device 100 for performing the analysis of a specimen according to measurement parameters set with respect to an agent to be used; and a management device 200 communicatively connected to the analyzing device via a network. The analyzing device 100 includes: a processing portion 120 and a transmission portion 126 for transmitting information to the management device 200. The processing portion 120 can execute processing of receiving the registration of the measurement parameters, and executes processing of transmitting transmission information including information indicating that the measurement parameters are registered from a transmission portion 126 to the management device 200 when the measurement parameters are registered.