INFRARED DETECTOR

PROBLEM TO BE SOLVED: To provide an infrared detector having a structure capable of reducing the height thereof, easily adjusting a view angle and enhancing efficiency of a manufacturing process.SOLUTION: Infrared rays 10 having a predetermined wave length and transmitting an optical filter 4 can ef...

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Bibliographische Detailangaben
Hauptverfasser:	HIRABAYASHI JUN, KOMURO EIJU
Format:	Patent
Sprache:	eng
Schlagworte:	COLORIMETRY MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an infrared detector having a structure capable of reducing the height thereof, easily adjusting a view angle and enhancing efficiency of a manufacturing process.SOLUTION: Infrared rays 10 having a predetermined wave length and transmitting an optical filter 4 can efficiently irradiate an infrared detecting element 2 with a required amount of the infrared rays by restricting a view angle through a second opening 9 provided by an adhesive 5. Efficiency of a manufacturing process is enhanced without increasing a distance from the infrared detecting element to the opening which restricts the view angle.