WAVEFORM OBSERVATION DEVICE

PROBLEM TO BE SOLVED: To reduce a depth dimension of a waveform observation device.SOLUTION: A waveform observation device includes a terminal block 25 to which a wire extending from an external device is connected, a memory 30 that receives measurement data via the terminal block 25 and stores it,...

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Bibliographische Detailangaben
Hauptverfasser:	ASADA SHINYA, ATORO TAKASHI
Format:	Patent
Sprache:	eng
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To reduce a depth dimension of a waveform observation device.SOLUTION: A waveform observation device includes a terminal block 25 to which a wire extending from an external device is connected, a memory 30 that receives measurement data via the terminal block 25 and stores it, a display 224 that displays the measurement data in a waveform, an integrated substrate 201 disposed within a body frame 205 of the waveform observation device in an upright posture, and a measurement module 230 coupled to the integrated substrate 201 by means of a connector. The measurement module 230 is connected to the terminal block 25 by means of a connector to constitute a measurement unit 23. The measurement unit 23 is positioned to protrude rearward from the body frame 205.