SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE

PROBLEM TO BE SOLVED: To ensure the interface uniformity of a substrate surface in batch processing of a semiconductor substrate.SOLUTION: A vertical SiC film formation apparatus is provided with: a reaction tube 42 forming a reaction space and composed mainly of quartz; an induction coil for heatin...

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Hauptverfasser: NISHIDO SHUHEI, SHIRAKO KENJI, SASAKI TAKASHI, FUKUDA MASANAO
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creator NISHIDO SHUHEI
SHIRAKO KENJI
SASAKI TAKASHI
FUKUDA MASANAO
description PROBLEM TO BE SOLVED: To ensure the interface uniformity of a substrate surface in batch processing of a semiconductor substrate.SOLUTION: A vertical SiC film formation apparatus is provided with: a reaction tube 42 forming a reaction space and composed mainly of quartz; an induction coil for heating a semiconductor wafer 14 held by a wafer holder 15 to a treatment temperature; a cylindrical heated body heated up by an eddy current generated by the induction coil and made of carbon graphite; and a heat insulation material 54 preventing a temperature of the reaction tube 42 from rising by radiated heat radiated by the heated body. In the vertical SiC film formation apparatus, a process gas 60 is jetted from a hole 62c disposed at a position higher than a top plate 30a of a boat 30 of a supply nozzle 62a thereby forming a flow of the process gas 60 that is active in the position higher than the top plate 30a of the boat 30.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_JP2013153110A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>JP2013153110A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_JP2013153110A3</originalsourceid><addsrcrecordid>eNqNijsKAjEUANNYiHqHh_UKG4MHeCYvboR8yMd2WSRWfhbW-6OFYGNhNTAzc3ZLZZ9yxEwQopeUknEHwBDw7Upq4Ge3lDuvGkCnwKIrGmUu8VvAa0hkjfROFZl9BEUnI2nJZpfhOtXVhwu21pRlt6njo6_TOJzrvT77Y9i2XPCd4LxF8df0AvWVN9Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE</title><source>esp@cenet</source><creator>NISHIDO SHUHEI ; SHIRAKO KENJI ; SASAKI TAKASHI ; FUKUDA MASANAO</creator><creatorcontrib>NISHIDO SHUHEI ; SHIRAKO KENJI ; SASAKI TAKASHI ; FUKUDA MASANAO</creatorcontrib><description>PROBLEM TO BE SOLVED: To ensure the interface uniformity of a substrate surface in batch processing of a semiconductor substrate.SOLUTION: A vertical SiC film formation apparatus is provided with: a reaction tube 42 forming a reaction space and composed mainly of quartz; an induction coil for heating a semiconductor wafer 14 held by a wafer holder 15 to a treatment temperature; a cylindrical heated body heated up by an eddy current generated by the induction coil and made of carbon graphite; and a heat insulation material 54 preventing a temperature of the reaction tube 42 from rising by radiated heat radiated by the heated body. In the vertical SiC film formation apparatus, a process gas 60 is jetted from a hole 62c disposed at a position higher than a top plate 30a of a boat 30 of a supply nozzle 62a thereby forming a flow of the process gas 60 that is active in the position higher than the top plate 30a of the boat 30.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130808&amp;DB=EPODOC&amp;CC=JP&amp;NR=2013153110A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130808&amp;DB=EPODOC&amp;CC=JP&amp;NR=2013153110A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NISHIDO SHUHEI</creatorcontrib><creatorcontrib>SHIRAKO KENJI</creatorcontrib><creatorcontrib>SASAKI TAKASHI</creatorcontrib><creatorcontrib>FUKUDA MASANAO</creatorcontrib><title>SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE</title><description>PROBLEM TO BE SOLVED: To ensure the interface uniformity of a substrate surface in batch processing of a semiconductor substrate.SOLUTION: A vertical SiC film formation apparatus is provided with: a reaction tube 42 forming a reaction space and composed mainly of quartz; an induction coil for heating a semiconductor wafer 14 held by a wafer holder 15 to a treatment temperature; a cylindrical heated body heated up by an eddy current generated by the induction coil and made of carbon graphite; and a heat insulation material 54 preventing a temperature of the reaction tube 42 from rising by radiated heat radiated by the heated body. In the vertical SiC film formation apparatus, a process gas 60 is jetted from a hole 62c disposed at a position higher than a top plate 30a of a boat 30 of a supply nozzle 62a thereby forming a flow of the process gas 60 that is active in the position higher than the top plate 30a of the boat 30.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijsKAjEUANNYiHqHh_UKG4MHeCYvboR8yMd2WSRWfhbW-6OFYGNhNTAzc3ZLZZ9yxEwQopeUknEHwBDw7Upq4Ge3lDuvGkCnwKIrGmUu8VvAa0hkjfROFZl9BEUnI2nJZpfhOtXVhwu21pRlt6njo6_TOJzrvT77Y9i2XPCd4LxF8df0AvWVN9Q</recordid><startdate>20130808</startdate><enddate>20130808</enddate><creator>NISHIDO SHUHEI</creator><creator>SHIRAKO KENJI</creator><creator>SASAKI TAKASHI</creator><creator>FUKUDA MASANAO</creator><scope>EVB</scope></search><sort><creationdate>20130808</creationdate><title>SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE</title><author>NISHIDO SHUHEI ; SHIRAKO KENJI ; SASAKI TAKASHI ; FUKUDA MASANAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_JP2013153110A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2013</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>NISHIDO SHUHEI</creatorcontrib><creatorcontrib>SHIRAKO KENJI</creatorcontrib><creatorcontrib>SASAKI TAKASHI</creatorcontrib><creatorcontrib>FUKUDA MASANAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NISHIDO SHUHEI</au><au>SHIRAKO KENJI</au><au>SASAKI TAKASHI</au><au>FUKUDA MASANAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE</title><date>2013-08-08</date><risdate>2013</risdate><abstract>PROBLEM TO BE SOLVED: To ensure the interface uniformity of a substrate surface in batch processing of a semiconductor substrate.SOLUTION: A vertical SiC film formation apparatus is provided with: a reaction tube 42 forming a reaction space and composed mainly of quartz; an induction coil for heating a semiconductor wafer 14 held by a wafer holder 15 to a treatment temperature; a cylindrical heated body heated up by an eddy current generated by the induction coil and made of carbon graphite; and a heat insulation material 54 preventing a temperature of the reaction tube 42 from rising by radiated heat radiated by the heated body. In the vertical SiC film formation apparatus, a process gas 60 is jetted from a hole 62c disposed at a position higher than a top plate 30a of a boat 30 of a supply nozzle 62a thereby forming a flow of the process gas 60 that is active in the position higher than the top plate 30a of the boat 30.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
title SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-22T16%3A10%3A19IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NISHIDO%20SHUHEI&rft.date=2013-08-08&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EJP2013153110A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true