METHOD FOR EVALUATING INFRARED SHIELDING FILM, AND METHOD FOR MANUFACTURING INFRARED SHIELDING FILM

PROBLEM TO BE SOLVED: To provide an evaluation method for appropriately obtaining a heat-shielding effect in an actual installation of a film in which an incident angle of sunlight changes.SOLUTION: An evaluation method for dielectric multilayer type infrared shielding films includes: a step (1) of...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	KOKEGUCHI NORIYUKI
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES LAYERED PRODUCTS LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PERFORMING OPERATIONS PHYSICS TESTING TRANSPORTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an evaluation method for appropriately obtaining a heat-shielding effect in an actual installation of a film in which an incident angle of sunlight changes.SOLUTION: An evaluation method for dielectric multilayer type infrared shielding films includes: a step (1) of obtaining a relation between a sunlight incident angle and irradiation energy at an installation place of a dielectric multilayer type infrared shielding film including a dielectric multilayer film; a step (2) of obtaining a central incident angle that is an incident angle in the irradiation energy reaching the maximum in the step (1); a step (3) of obtaining a short wave-side band uplink wavelength λ from a spectrophotometric curve in the central incident angle of the dielectric multilayer type infrared shielding film; and a step (4) for evaluating A=\|λ-700nm\| as a numerical index.