SPECIMEN PARAMETER ESTIMATION DEVICE AND METHOD FOR DETECTING MECHANICAL RESONANCE FREQUENCY

PROBLEM TO BE SOLVED: To solve such a problem that when resonance suppression control for suppressing mechanical resonance is applied, resetting of a mechanical parameter is required in each change of a specimen and quick estimation of a mechanical model is difficult.SOLUTION: Model board diagram ca...

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Bibliographische Detailangaben
Hauptverfasser: AKIYAMA GAKUO, SAWADA YOSHIMASA
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To solve such a problem that when resonance suppression control for suppressing mechanical resonance is applied, resetting of a mechanical parameter is required in each change of a specimen and quick estimation of a mechanical model is difficult.SOLUTION: Model board diagram calculation means prepares a plurality of estimation candidate values (J[k] (k=1,2,3 to N)) of specimen inertia moment Jout of model parameters, sets other model parameters of a dynamometer system and calculates model board diagram data H. Evaluation function operation means calculates an evaluation function F by integrating an absolute value of (H-H)/Hin frequencies ωto ωpreviously set by a logarithmic scale by using the model board diagram data Hand a frequency response H. Evaluation function minimizing means determines estimation candidate values of the specimen inertia moment Jfor minimizing the calculated evaluation function F. A transfer function of the model is calculated by using minimizing inertia moment Jand the other model parameters of the dynamometer system.