SPECIMEN PARAMETER ESTIMATION DEVICE AND METHOD FOR DETECTING MECHANICAL RESONANCE FREQUENCY
PROBLEM TO BE SOLVED: To solve such a problem that when resonance suppression control for suppressing mechanical resonance is applied, resetting of a mechanical parameter is required in each change of a specimen and quick estimation of a mechanical model is difficult.SOLUTION: Model board diagram ca...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | PROBLEM TO BE SOLVED: To solve such a problem that when resonance suppression control for suppressing mechanical resonance is applied, resetting of a mechanical parameter is required in each change of a specimen and quick estimation of a mechanical model is difficult.SOLUTION: Model board diagram calculation means prepares a plurality of estimation candidate values (J[k] (k=1,2,3 to N)) of specimen inertia moment Jout of model parameters, sets other model parameters of a dynamometer system and calculates model board diagram data H. Evaluation function operation means calculates an evaluation function F by integrating an absolute value of (H-H)/Hin frequencies ωto ωpreviously set by a logarithmic scale by using the model board diagram data Hand a frequency response H. Evaluation function minimizing means determines estimation candidate values of the specimen inertia moment Jfor minimizing the calculated evaluation function F. A transfer function of the model is calculated by using minimizing inertia moment Jand the other model parameters of the dynamometer system. |
---|