INSPECTION METHOD AND INSPECTION SYSTEM
PROBLEM TO BE SOLVED: To provide an inspection method capable of inspecting a defect that a lamination film is not penetrated concerning the lamination film where insulation layers are laminated on both of the surfaces of a metal layer.SOLUTION: An inspection method of the present invention being th...
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Format: | Patent |
Sprache: | eng |
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Zusammenfassung: | PROBLEM TO BE SOLVED: To provide an inspection method capable of inspecting a defect that a lamination film is not penetrated concerning the lamination film where insulation layers are laminated on both of the surfaces of a metal layer.SOLUTION: An inspection method of the present invention being the inspection method for inspecting the defect of a lamination film where insulation layers are laminated on both of the surfaces of a metal layer includes a voltage application process and a detection process. In the voltage application process, a voltage is applied between a first electrode that is brought into contact with the surface of the lamination film to which a conductive liquid is supplied while supplying the liquid to the surface of the lamination film and a second electrode that is brought into contact with the end of the metal layer to be exposed from the end of the lamination film. In the detection process, an electric conduction state between the first and second electrodes to which the voltage is applied is detected. |
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