TEST MEASURING INSTRUMENT AND METHOD IN TEST MEASURING INSTRUMENT

PROBLEM TO BE SOLVED: To optimize the detection of both a signal level and a noise level.SOLUTION: A test measuring instrument includes an input part for receiving an input test signal, and a separation part for separating a data array of the input test signal into many different data bins. A select...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: KATHRYN A ENGHOLM, MARCUS K DA SILVA
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To optimize the detection of both a signal level and a noise level.SOLUTION: A test measuring instrument includes an input part for receiving an input test signal, and a separation part for separating a data array of the input test signal into many different data bins. A selector operates together with an evaluation processor 560 for determining whether a data point in the current bin among the whole bins represents a signal or represents noise. In the case that the current bin represents the noise, a processor generates a first output about the current bin. Contrarily, in the case that the current bin includes the signal, the processor generates a second output about the current bin. The plurality of bin outputs can be combined so as to form an output array for a device, such as waveform display.