RESIST COMPOSITION, METHOD FOR FORMING RESIST PATTERN, NOVEL COMPOUND, AND ACID GENERATOR

PROBLEM TO BE SOLVED: To provide a resist composition excellent in lithographic characteristics, a method for forming a resist pattern, a novel compound, and an acid generator.SOLUTION: The resist composition comprises a base component (A) the solubility of which with a developing solution changes b...

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Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a resist composition excellent in lithographic characteristics, a method for forming a resist pattern, a novel compound, and an acid generator.SOLUTION: The resist composition comprises a base component (A) the solubility of which with a developing solution changes by an action of an acid, and an acid generator component (B) that generates an acid by exposure. The acid generator component (B) includes an acid generator (B1) comprising a compound expressed by formula (b1-1). In the formula, Zrepresents an organic cation; Qand Qrepresent a fluorine atom or a straight-chain or branched-chain 1-6C fluorinated alkyl group; X represents -(CH)-; Y represents a single bond, -O-(CH)- or -C(=O)-O-(CH)-; L1 and m1 represent an integer of 1 to 6; Rx represents a 2-36C divalent aliphatic hydrocarbon group having a C=C unsaturated bond and optionally having a substituent; and Ry represents an acid dissociable group.