EXAMINATION OR OBSERVATION DEVICE, AND EXAMINATION OR OBSERVATION METHOD OF SAMPLE

PROBLEM TO BE SOLVED: To provide an examination device, an observation device capable of accurately examining or observing sample with a charged particle technology or an optical technology conveniently.SOLUTION: The determination device or observation device includes: a first housing for forming at...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	OMINAMI YUSUKE, KOI ASAMI, ITO SUKEHIRO, OTAKI TOMOHISA, KASAI SHINSUKE
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!