LOW INTERNAL STRESS COPPER ELECTROPLATING METHOD

PROBLEM TO BE SOLVED: To provide a copper electroplating method which alleviates internal stress in copper deposits.SOLUTION: The method includes contacting a substrate with a composition containing one or more sources of copper ions, one or more suppressors and one or more accelerators in sufficien...

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Bibliographische Detailangaben
Hauptverfasser: KARAYA NARSMOUL, ALLARDYCE GEORGE R, GARY HAM
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a copper electroplating method which alleviates internal stress in copper deposits.SOLUTION: The method includes contacting a substrate with a composition containing one or more sources of copper ions, one or more suppressors and one or more accelerators in sufficient amounts to provide a copper deposit of matt appearance. The accelerators include 3-mercaptopropane-1-sulfonic acid, ethylenedithiodipropyl sulfonic acid, bis-(ω-sulfobutyl)-disulfide, methyl-(ω-sulfopropyl)-disulfide, N,N-dimethyldithiocarbamic acid(3-sulfopropyl)ester, (O-ethyldithiocarbonato)-S-(3-sulfopropyl)-ester, 3-[(amino-iminomethyl)-thiol]-1-propanesulfonic acid, 3-(2-benzylthiazolylthio)-1-propanesulfonic acid, bis-(sulfopropyl)-disulfide and alkali metal salts thereof.