SYSTEMS AND METHODS FOR AUTOMATED ANOMALY LOCATION AND CLASSIFICATION

PROBLEM TO BE SOLVED: To provide inspection of manufactured components and systems, and more specifically, provide systems and methods for automated manufacturing anomaly location and classification.SOLUTION: The system further includes a system controller 322 and a probe locating device 326. A prob...

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Bibliographische Detailangaben
Hauptverfasser:	JOHNSON BRICE A, RICHARD N BLAIR, MATTHEW W SMITH, PEDIGO SAMUEL F, KIMBERLY J KAISER, JAMES M COBB, CRAIG F BATTLES, DONALD L KAISER, LI WINFENG
Format:	Patent
Sprache:	eng
Schlagworte:	CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTEDFOR SPECIFIC APPLICATION FIELDS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide inspection of manufactured components and systems, and more specifically, provide systems and methods for automated manufacturing anomaly location and classification.SOLUTION: The system further includes a system controller 322 and a probe locating device 326. A probe 320 is operable, via a user interface, for transmitting, via communications interface, a user-selected anomaly type to the system controller 322, the anomaly type being associated with a manufactured part or airplane on the ground (AOG). The probe locating device 326 is operable to provide the system controller 322 with a location associated with a probe tip, and the system is programmed to associate the user-selected anomaly type with the location associated with the probe tip.