LASER PRINTING METHOD FOR NTD SEMICONDUCTOR SUBSTRATE

PROBLEM TO BE SOLVED: To provide a laser printing method for a semiconductor substrate, capable of displaying a character pattern and a discrimination pattern with an uneven shaped printing dot engraving having an excellent depth for visibility even for an NTD silicon wafer by using a YVO4 laser bea...

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Bibliographische Detailangaben
Hauptverfasser: SAKAGUCHI HIROSHI, TAKEDA HISAO, YAO NORIAKI, WARATANI SHUZO, MAIKUMA KEN
Format: Patent
Sprache:eng
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Zusammenfassung:PROBLEM TO BE SOLVED: To provide a laser printing method for a semiconductor substrate, capable of displaying a character pattern and a discrimination pattern with an uneven shaped printing dot engraving having an excellent depth for visibility even for an NTD silicon wafer by using a YVO4 laser beam.SOLUTION: The laser printing method for a semiconductor substrate comprises processes of: applying a heat treatment at 200°C or higher for 30 minutes or longer to a semiconductor substrate 1 having a damage in an atomic arrangement of a crystal lattice caused by neutron ray irradiation; and engraving a required discrimination pattern by irradiating a marginal part of a surface of the semiconductor substrate 1 with a YVO4 laser.