ANALYZER, ANALYSIS METHOD, AND COMPUTER PROGRAM

PROBLEM TO BE SOLVED: To provide an analysis system capable of ensuring that samples are analyzed in correct procedures when the samples are analyzed, even if an operator does not properly follow procedures for measurement of samples.SOLUTION: An analyzer 105 for analyzing samples comprises: a measu...

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Bibliographische Detailangaben
Hauptverfasser:	PETER OSELLA, RALPH TAYLOR, JAMES AUSDENMOORE
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide an analysis system capable of ensuring that samples are analyzed in correct procedures when the samples are analyzed, even if an operator does not properly follow procedures for measurement of samples.SOLUTION: An analyzer 105 for analyzing samples comprises: a measuring hardware 128 for measuring samples; and a first controller 127. The analyzer is configured to have first pre-measurement processing urged to be applied to the samples and, after a predetermined time has elapsed, to have second pre-measurement processing urged to be applied to the samples, before measurement of the samples is performed.