METHOD AND DEVICE FOR COLLECTION OF SAMPLE FRACTION AND ANALYSIS OF SAMPLE

PROBLEM TO BE SOLVED: To provide a method for using at least one detector to analyze a sample, and a device for the same.SOLUTION: A method includes steps of: generating a first signal from at least one destructive detector including at least one evaporable particle detector, for generating a respon...

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Hauptverfasser:	BRUCE D BLACK, RAAIDAH SAARI-NORDHAUS, MENDOZA WASHINGTON, DENIS K MCCREERY, JAMES M ANDERSON JR, DARC HERGEMO, KARL H POPPER, JOSEPH P VISTORON, NEAL R PISYA, NELSON SHELDON
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a method for using at least one detector to analyze a sample, and a device for the same.SOLUTION: A method includes steps of: generating a first signal from at least one destructive detector including at least one evaporable particle detector, for generating a response value during execution of chromatography; and generating a second signal from at least one non-destructive detector, for generating the response value during the execution of the chromatography. The destructive detector enables positive detection of a response value of one or more sample elements when one or more chromogenic solvents that hide the positive detection of one or more detection responses from the non-destructive detector exist. The method also includes a step of collecting the sample elements from a flow within a fraction collector.