SURFACE SHAPE MEASUREMENT PROBE AND CALIBRATION METHOD THEREOF

PROBLEM TO BE SOLVED: To provide a surface shape measurement probe for performing the calibration of stylus top end coordinates by a master ball and its calibration method.SOLUTION: A contactor 35 for calibration is mounted on the neighborhood of a stylus 31 of a surface shape measurement probe 30 s...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	MICHIWAKI HIROKAZU
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!