IMAGING ELEMENT AND IMAGING DEVICE

PROBLEM TO BE SOLVED: To improve characteristics of a phase difference detection pixel in an imaging element.SOLUTION: A microlens 314 collects light from a subject. A light-receiving element 313 generates a signal for focus determination with phase difference detection by receiving the subject ligh...

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Bibliographische Detailangaben
Hauptverfasser:	FUJII SHINICHI, SHIMODA KAZUTO
Format:	Patent
Sprache:	eng
Schlagworte:	ACCESSORIES THEREFOR APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USINGWAVES OTHER THAN OPTICAL WAVES APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FORPROJECTING OR VIEWING THEM BASIC ELECTRIC ELEMENTS CINEMATOGRAPHY ELECTRIC COMMUNICATION TECHNIQUE ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHOTOGRAPHY PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION SEMICONDUCTOR DEVICES
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To improve characteristics of a phase difference detection pixel in an imaging element.SOLUTION: A microlens 314 collects light from a subject. A light-receiving element 313 generates a signal for focus determination with phase difference detection by receiving the subject light collected by the microlens 314. A light-shielding layer 312 is positioned between the microlens 314 and the light-receiving element 313 and pupil-divides the subject light by shading a part of the subject light. The light-shielding layer 312 is also set so that an imaging point position of the microlens 314 separates from an end part position on the incident port side of the light-shielding layer 312 according to image height change.