PROBE DEVICE AND METHOD FOR CLEANING TEST OBJECT

PROBLEM TO BE SOLVED: To prevent damage of a CF substrate by a cleaning device.SOLUTION: A probe device is arranged at an upper part of a test object with an electrode, and includes: a probe device body; a cleaning device coupled to the probe device body; and a coupling device coupling the cleaning...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NARAOKA SHUJI, OSANAI YASUAKI
Format: Patent
Sprache:eng
Schlagworte:
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