CONTACT PROBE FOR POWER DEVICE

PROBLEM TO BE SOLVED: To provide a contact probe for a semiconductor power device, of which resistance value is substantially constant at every time of contact, enabling to be used as the contact probe for the semiconductor power device without hindrance, and which can be used a number of times without hindrance to show a long service life.SOLUTION: Resistance value can be substantially constant at every time of contact, by forming a sleeve of a member having a spring property and forming a slit downward from a tip of the sleeve which has a protrusion in the inner periphery of the position of the slit. A plunger is slidably fitted to the sleeve, an insulating tube formed of a heat resistant material fixed to the plunger is fitted to the sleeve, a coil spring is fixed to the outer periphery of the insulating tube or positioned in another insulating tube fitted to the sleeve, and the spring coil is pressed by the insulating tube fixed to the plunger. Thereby, a long service life contact probe can be made.