CONNECTOR INSPECTING METHOD

PROBLEM TO BE SOLVED: To provide a connector inspecting method for estimating whether a segment portion of a connector has excellent contact performance to a terminal portion which is provided to an electronic part such as a memory module or the like to be fitted to the segment portion.SOLUTION: A c...

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Bibliographische Detailangaben
Hauptverfasser: MIURA YUJI, SHIKI TOMOHIKO, SADAKANE YASUKAZU, KAWAKAMI TOMOKO, KOKAJI OSAMU, INAKAZU HIROYUKI
Format: Patent
Sprache:eng
Schlagworte:
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Beschreibung
Zusammenfassung:PROBLEM TO BE SOLVED: To provide a connector inspecting method for estimating whether a segment portion of a connector has excellent contact performance to a terminal portion which is provided to an electronic part such as a memory module or the like to be fitted to the segment portion.SOLUTION: A connector inspecting method comprises: a step of electrically connecting each segment portion 13 of a connector 10 under inspection to each terminal portion 14 of a memory module 12 in series to measure a first resistance value of the overall in-series connection; a step of fitting to the connector 10 under inspection a memory module 12 having each terminal portion to which silica sand (powder) adheres and electrically connecting each terminal portion 14 of the memory module 12 to each segment portion 13 of the connector under inspection to measure a second resistance value of the overall in-series connection; a step of calculating the differential resistance value between the first and second resistance values; and a step of determining the contact state of each segment portion 13 of the connector 10 under inspection to each terminal portion 14 on the basis of whether the calculated differential resistance value is within a predetermined range.