DEVICE AND METHOD FOR MEASURING IMAGE SURFACE

DEVICE AND METHOD FOR MEASURING IMAGE SURFACE

PROBLEM TO BE SOLVED: To provide a device and method for measuring an image surface in which the time to be required for measurement of the image surface formed by a lens unit including at least one lens is shortened without reducing measurement accuracy.SOLUTION: Imaging data is output from an imag...

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Hauptverfasser: TAKENAKA KENICHI, FUKUNISHI TATSUYA
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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creator TAKENAKA KENICHI
FUKUNISHI TATSUYA
description PROBLEM TO BE SOLVED: To provide a device and method for measuring an image surface in which the time to be required for measurement of the image surface formed by a lens unit including at least one lens is shortened without reducing measurement accuracy.SOLUTION: Imaging data is output from an imaging element which images an inspecting chart via the lens unit, and based on the imaging data, a state of the image surface formed by the lens unit is measured by a measurement part. At this time, imaging control signals for designating a plurality of partial areas out of the entire imaging region on the imaging element are output from a control part. Moreover, based on the imaging control signals, the imaging data is output only from pixels disposed in a plurality of areas through a scanning circuit.
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subjects MEASURING
PHYSICS
TESTING
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES
TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title DEVICE AND METHOD FOR MEASURING IMAGE SURFACE
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