STRAIN MEASURING DEVICE AND STRAIN MEASURING SYSTEM

PROBLEM TO BE SOLVED: To provide a strain measuring device and strain measuring system that simply and accurately measure a strain generated on a surface of a measurement object from a remote position without directly measuring the strain.SOLUTION: A strain measuring system 1 includes a first imagin...

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Bibliographische Detailangaben
Hauptverfasser:	TAJO SHUNSUKE, TEZUKA YASUHARU, SAKAI KATSUYUKI, NAKAMURA TOSHIO
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	PROBLEM TO BE SOLVED: To provide a strain measuring device and strain measuring system that simply and accurately measure a strain generated on a surface of a measurement object from a remote position without directly measuring the strain.SOLUTION: A strain measuring system 1 includes a first imaging device 3 that frontally images a measurement object area S of the surface of the measurement object 2, a second imaging device 5 that images the side face of the measurement object 2, and a measurement device 10 that calculates the strain generated on the measurement object 2 based on the images imaged by the first imaging device 3 and the second imaging device 5.